Services

The MBE and MOCVD epitaxial structures
III-V Epi makes are used in:

Lasers

DFBs, FPs, QCLs, BALs, VCSELs,

LEDs

visible to MIR, including RCLEDs

Our Expertise

Our expertise includes the development of chips, components, modules and subsystems based on advanced semiconductor technology for fiber networks, wireless optical networks and sensors.

We work closely with the James Watt School of Engineering, Electronic and Nanoscale Engineering Division at the University of Glasgow.

We have access to a world-class engineering and research team for wafer process optimisation, characterisation and test.

We have sovereign MBE and MOCVD capability for the UK.

Test and Characterisation

Electrical:

  • HR-XRD, PL & reflectivity mapping
  • Hall effect, eCV
  • Photocurrent spectroscopy
  • Laser diode characterisation

Optical:

  • Optical characterisation from UV to Mid-IR
  • PL and reflectivity mapping
  • Low temperature PL wafer mapping, and micro-PL mapping
  • Fabrication of test structures – e.g. optical access mesa diodes and broad area lasers

Call us today at +44 (0) 141 266 0115
or email us at info@iii-vepi.com

We look forward to hearing from you.

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