Over-specifying the epitaxy layers in a wafer structure dramatically increases costs. Prof. Richard Hogg and Dr. Neil Gerrard’s article, “Specifying Epitaxial Wafers for Optimal Cost and Performance”, looks at some common examples of over-specifying epitaxy which could be avoided, such as:
- Definition of alloy compositions which exceed that of the characterisation process.
- Specification of doping level tolerance that exceeds what can be assured with standard equipment in the laboratory.
- Use of ternary layers where a binary would be sufficient. For example, is an InAs₀.₀₁ P₀.₉₉ layer really needed, or would a standard
- InP layer be an acceptable substitute?
Use of “exotic alloys” that will need extra work to assure. If a very specific material is required, it can often be produced, but the resulting assurance takes time, effort, and cost.
Let the experts at III-V Epi help with wafer specification to ensure it is optimised for fabrication.
