GaAs/AlAs DBRs – Wafer Mapping

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~100% Reflectivity,  & Excellent Uniformity MOCVD grown DBRs, developing our VECSEL technologies, were assessed in terms of wafer uniformity. Excellent radial uniformity was observed, with expected high reflectivities and low…
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Advanced InP Re-Growth

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InP photonic crystal surface emitting laser (PCSEL) Very high aspect ratio features Significant experience and research in MOCVD epitaxial re-growth has allowed very high aspect ratio structures to be successfully…
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InP Buried-Heterostructures

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This core MOCVD technology is applied to InP devices and PICs for engineering symmetric far-fields, ensuring efficient heat-extraction, and in low noise amplifiers. Images show (left) stained images of realised…
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InP DFB Re-Growth

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Iteration of MOCVD epitaxial re-growth, TEM structural characterisation, and device test of re-grown devices allows process development and transfer to volume manufacture.
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